Data Analyst

Marconi Communications

Data Analyst in the TQM Group focusing on improving Quality related indices specifically related to electronic print-circuit board manufacturing, including, at the time, cutting-edge voice, video and data transmission equipment in the Telecom industry.

Existing attribute data reports incorporated into the new parametric data reporting system.

  • The existing attribute reporting would give us trends and paretos by product and test step
  • The parametric reporting provided detailed test data by the actual measurements within the test specification.
    • Initial sneakernet system migrated to a networked SQL Server 2000 database for parametric data collection
  • The Repair tracking implemented along with the data collection provided direct relationships to be established between product design, test equipment and component performance.

The reporting systems in place were combined with the new data reporting that provided a comprehensive view of the highest volume as well as newest technology products during production as well as in the customer’s premises.

Reporting was continuous; additionally, formal meetings to take action based upon the results were implemented by TQM. These meetings were attended by

  • Design Engineering
  • Reliability Engineering,
  • Component Engineering
  • Test Engineering
  • Manufacturing
  • Quality Assurance (TQM)

These meetings resulted in improvements in product designs, improved test processing, improvements from component vendors, changes to internal deviation processing, and manufacturing processes.

The results of these improvements were significant reductions to the ‘bone pile’, improved on-time-delivery, increased productivity, lowered scrap & rework costs, lowered inventory costs and improved field failure rates.

Studies conducted on new development products used Gage R&R and Halt-Hass “shake & bake” screening to intelligently, and confidently, eliminate redundant tests, modify test parameters, as well as reducing the required capacity at multiple test processes like Burn-In and System test. The greatest saving came from reducing the capacity required for our highest volume products where a single test station ran at over $150K each.

This position allowed me to see first-hand how nominal designs, components and equipment will prevent acceptable operating costs due to low yields and productivity, increased costs due to scrap and rework and worst of all late or missed customer deliveries. It also showed me that data will lead you to the issues at hand and allow for dramatic, long-term improvements in ways that hearsay and lectures will never accomplish.

 

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